Ziyang Ye, Makoto Ikeda. Assessing the Vulnerability of Time-Controlled Logic-Loop-Based Circuits to Voltage Fault Injection and Power Monitoring Attacks. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 112-115, IEEE, 2023. [doi]
@inproceedings{YeI23-0,
title = {Assessing the Vulnerability of Time-Controlled Logic-Loop-Based Circuits to Voltage Fault Injection and Power Monitoring Attacks},
author = {Ziyang Ye and Makoto Ikeda},
year = {2023},
doi = {10.1109/ICICDT59917.2023.10332297},
url = {https://doi.org/10.1109/ICICDT59917.2023.10332297},
researchr = {https://researchr.org/publication/YeI23-0},
cites = {0},
citedby = {0},
pages = {112-115},
booktitle = {International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1931-6},
}