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Autonomous Testing for 3D-ICs with IEEE Std. 1687

Jin-Cun Ye, Michael A. Kochte, Kuen-Jong Lee, Hans-Joachim Wunderlich. Autonomous Testing for 3D-ICs with IEEE Std. 1687. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 215-220, IEEE Computer Society, 2016. [doi]

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