Dong Hye Ye, Kilian M. Pohl, Harold Litt, Christos Davatzikos. Groupwise morphometric analysis based on high dimensional clustering. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2010, San Francisco, CA, USA, 13-18 June, 2010. pages 47-54, IEEE Computer Society, 2010. [doi]
Abstract is missing.