Shuiming Ye, Qibin Sun, Ee-Chien Chang. Error Resilient Image Authentication Using Feature Statistical and Spatial Properties. In Yun-Qing Shi, Byeungwoo Jeon, editors, Digital Watermarking, 5th International Workshop, IWDW 2006, Jeju Island, Korea, November 8-10, 2006, Proceedings. Volume 4283 of Lecture Notes in Computer Science, pages 461-472, Springer, 2006. [doi]
Abstract is missing.