Gu Ye, Yu Xiang, Vladimir Cuk, Joseph F. G. Cobben. Voltage dip state estimation in distribution networks by applying Bayesian inference. In IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society, Yokohama, Japan, November 9-12, 2015. pages 915-920, IEEE, 2015. [doi]
Abstract is missing.