Instance Specific Metric Subspace Learning: A Bayesian Approach

Han-Jia Ye, De-Chuan Zhan, Yuan Jiang. Instance Specific Metric Subspace Learning: A Bayesian Approach. In Dale Schuurmans, Michael P. Wellman, editors, Proceedings of the Thirtieth AAAI Conference on Artificial Intelligence, February 12-17, 2016, Phoenix, Arizona, USA. pages 2272-2278, AAAI Press, 2016. [doi]

@inproceedings{YeZJ16,
  title = {Instance Specific Metric Subspace Learning: A Bayesian Approach},
  author = {Han-Jia Ye and De-Chuan Zhan and Yuan Jiang},
  year = {2016},
  url = {http://www.aaai.org/ocs/index.php/AAAI/AAAI16/paper/view/12175},
  researchr = {https://researchr.org/publication/YeZJ16},
  cites = {0},
  citedby = {0},
  pages = {2272-2278},
  booktitle = {Proceedings of the Thirtieth AAAI Conference on Artificial Intelligence, February 12-17, 2016, Phoenix, Arizona, USA},
  editor = {Dale Schuurmans and Michael P. Wellman},
  publisher = {AAAI Press},
}