Instance Specific Metric Subspace Learning: A Bayesian Approach

Han-Jia Ye, De-Chuan Zhan, Yuan Jiang. Instance Specific Metric Subspace Learning: A Bayesian Approach. In Dale Schuurmans, Michael P. Wellman, editors, Proceedings of the Thirtieth AAAI Conference on Artificial Intelligence, February 12-17, 2016, Phoenix, Arizona, USA. pages 2272-2278, AAAI Press, 2016. [doi]

Abstract

Abstract is missing.