An on-line testable UART implemented using IFIS

J. Yeandel, D. Thulborn, S. Jones. An on-line testable UART implemented using IFIS. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 344-349, IEEE Computer Society, 1997. [doi]

Authors

J. Yeandel

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D. Thulborn

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S. Jones

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