An on-line testable UART implemented using IFIS

J. Yeandel, D. Thulborn, S. Jones. An on-line testable UART implemented using IFIS. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 344-349, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.