Relative features for photo quality assessment

Mei-Chen Yeh, Yu-Chen Cheng. Relative features for photo quality assessment. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 2861-2864, IEEE, 2012. [doi]

Authors

Mei-Chen Yeh

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Yu-Chen Cheng

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