Mei-Chen Yeh, Yu-Chen Cheng. Relative features for photo quality assessment. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 2861-2864, IEEE, 2012. [doi]
@inproceedings{YehC12a,
title = {Relative features for photo quality assessment},
author = {Mei-Chen Yeh and Yu-Chen Cheng},
year = {2012},
doi = {10.1109/ICIP.2012.6467496},
url = {http://dx.doi.org/10.1109/ICIP.2012.6467496},
researchr = {https://researchr.org/publication/YehC12a},
cites = {0},
citedby = {0},
pages = {2861-2864},
booktitle = {19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2534-9},
}