A Systematic Approach to Memory Test Time Reduction - researchr publication authors

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Jen-Chieh Yeh, Chao-Hsun Chen, Cheng-Wen Wu, Shuo-Fen Kuo. A Systematic Approach to Memory Test Time Reduction. IEEE Design & Test of Computers, 25(6):560-570, 2008. [doi]

This author has not been identified. Look up 'Jen-Chieh Yeh' in GoogleThis author has not been identified. Look up 'Chao-Hsun Chen' in GoogleThis author has not been identified. Look up 'Cheng-Wen Wu' in GoogleThis author has not been identified. Look up 'Shuo-Fen Kuo' in Google

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