Chih-Ting Yeh, Ming-Dou Ker. PMOS-based power-rail ESD clamp circuit with adjustable holding voltage controlled by ESD detection circuit. Microelectronics Reliability, 53(2):208-214, 2013. [doi]
@article{YehK13,
title = {PMOS-based power-rail ESD clamp circuit with adjustable holding voltage controlled by ESD detection circuit},
author = {Chih-Ting Yeh and Ming-Dou Ker},
year = {2013},
doi = {10.1016/j.microrel.2012.09.016},
url = {http://dx.doi.org/10.1016/j.microrel.2012.09.016},
researchr = {https://researchr.org/publication/YehK13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {2},
pages = {208-214},
}