Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions

Mustafa Berke Yelten. Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions. IEEE Trans. Circuits Syst. II Express Briefs, 69(6):2635-2640, 2022. [doi]

Abstract

Abstract is missing.