Y. T. Yen. A method of automatic fault-detection test generation for four-phase MOS LSI circuits. In American Federation of Information Processing Societies: AFIPS Conference Proceedings: 1969 Spring Joint Computer Conference, Boston, MA, USA, May 14-16, 1969. Volume 34 of AFIPS Conference Proceedings, pages 215-220, AFIPS Press, 1969. [doi]
@inproceedings{Yen69,
title = {A method of automatic fault-detection test generation for four-phase MOS LSI circuits},
author = {Y. T. Yen},
year = {1969},
doi = {10.1145/1476793.1476829},
url = {http://doi.acm.org/10.1145/1476793.1476829},
researchr = {https://researchr.org/publication/Yen69},
cites = {0},
citedby = {0},
pages = {215-220},
booktitle = {American Federation of Information Processing Societies: AFIPS Conference Proceedings: 1969 Spring Joint Computer Conference, Boston, MA, USA, May 14-16, 1969},
volume = {34},
series = {AFIPS Conference Proceedings},
publisher = {AFIPS Press},
}