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A method of automatic fault-detection test generation for four-phase MOS LSI circuits

Y. T. Yen. A method of automatic fault-detection test generation for four-phase MOS LSI circuits. In American Federation of Information Processing Societies: AFIPS Conference Proceedings: 1969 Spring Joint Computer Conference, Boston, MA, USA, May 14-16, 1969. Volume 34 of AFIPS Conference Proceedings, pages 215-220, AFIPS Press, 1969. [doi]

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