Defect inspection of disposable glucose test strips using machine vision

Hsu-Nan Yen, Wei-chen Lee. Defect inspection of disposable glucose test strips using machine vision. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2014, Taipei, Taiwan, May 26-28, 2014. pages 133-134, IEEE, 2014. [doi]

Authors

Hsu-Nan Yen

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Wei-chen Lee

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