Hsu-Nan Yen, Wei-chen Lee. Defect inspection of disposable glucose test strips using machine vision. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2014, Taipei, Taiwan, May 26-28, 2014. pages 133-134, IEEE, 2014. [doi]
@inproceedings{YenL14,
title = {Defect inspection of disposable glucose test strips using machine vision},
author = {Hsu-Nan Yen and Wei-chen Lee},
year = {2014},
doi = {10.1109/ICCE-TW.2014.6904022},
url = {https://doi.org/10.1109/ICCE-TW.2014.6904022},
researchr = {https://researchr.org/publication/YenL14},
cites = {0},
citedby = {0},
pages = {133-134},
booktitle = {IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2014, Taipei, Taiwan, May 26-28, 2014},
publisher = {IEEE},
}