Inspection of polarizer tiny bump defects using computer vision

Hsu-Nan Yen, Min-Jyun Syu. Inspection of polarizer tiny bump defects using computer vision. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 525-527, IEEE, 2015. [doi]

Authors

Hsu-Nan Yen

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Min-Jyun Syu

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