Hsu-Nan Yen, Min-Jyun Syu. Inspection of polarizer tiny bump defects using computer vision. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 525-527, IEEE, 2015. [doi]
@inproceedings{YenS15,
title = {Inspection of polarizer tiny bump defects using computer vision},
author = {Hsu-Nan Yen and Min-Jyun Syu},
year = {2015},
doi = {10.1109/ICCE.2015.7066510},
url = {https://doi.org/10.1109/ICCE.2015.7066510},
researchr = {https://researchr.org/publication/YenS15},
cites = {0},
citedby = {0},
pages = {525-527},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7543-3},
}