A training sample sequence planning method for pattern recognition problems

Chen-Wen Yen, Chieh-Neng Young, Mark L. Nagurka. A training sample sequence planning method for pattern recognition problems. Automatica, 41(4):575-581, 2005. [doi]

Authors

Chen-Wen Yen

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Chieh-Neng Young

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Mark L. Nagurka

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