Chen-Wen Yen, Chieh-Neng Young, Mark L. Nagurka. A training sample sequence planning method for pattern recognition problems. Automatica, 41(4):575-581, 2005. [doi]
@article{YenYN05,
title = {A training sample sequence planning method for pattern recognition problems},
author = {Chen-Wen Yen and Chieh-Neng Young and Mark L. Nagurka},
year = {2005},
doi = {10.1016/j.automatica.2004.10.012},
url = {http://dx.doi.org/10.1016/j.automatica.2004.10.012},
researchr = {https://researchr.org/publication/YenYN05},
cites = {0},
citedby = {0},
journal = {Automatica},
volume = {41},
number = {4},
pages = {575-581},
}