High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization

Junho Yeo, Jong-Ig Lee. High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization. Sensors, 19(3):498, 2019. [doi]

Abstract

Abstract is missing.