Seunghoon Yi, Hee-Cheol Joo, Seung Chae Jung, Yoochang Kim, Young Ha Hwang. PSP Model-Based Emulation Method for Geometry-Dependent Cryogenic Effects in 28-nm Bulk CMOS Technology. In International Conference on Electronics, Information, and Communication, ICEIC 2024, Taipei, Taiwan, January 28-31, 2024. pages 1-3, IEEE, 2024. [doi]
Abstract is missing.