Wooseok Yi, Yulhwa Kim, Jae-Joon Kim. Effect of Device Variation on Mapping Binary Neural Network to Memristor Crossbar Array. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 320-323, IEEE, 2019. [doi]
@inproceedings{YiKK19,
title = {Effect of Device Variation on Mapping Binary Neural Network to Memristor Crossbar Array},
author = {Wooseok Yi and Yulhwa Kim and Jae-Joon Kim},
year = {2019},
doi = {10.23919/DATE.2019.8714817},
url = {https://doi.org/10.23919/DATE.2019.8714817},
researchr = {https://researchr.org/publication/YiKK19},
cites = {0},
citedby = {0},
pages = {320-323},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
publisher = {IEEE},
isbn = {978-3-9819263-2-3},
}