Low-Cost Scan Test for IEEE-1500-Based SoC

Hyunbean Yi, Jaehoon Song, Sungju Park. Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE T. Instrumentation and Measurement, 57(5):1071-1078, 2008. [doi]

Authors

Hyunbean Yi

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Jaehoon Song

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Sungju Park

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