Hyunbean Yi, Jaehoon Song, Sungju Park. Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE T. Instrumentation and Measurement, 57(5):1071-1078, 2008. [doi]
@article{YiSP08,
title = {Low-Cost Scan Test for IEEE-1500-Based SoC},
author = {Hyunbean Yi and Jaehoon Song and Sungju Park},
year = {2008},
doi = {10.1109/TIM.2007.911699},
url = {http://dx.doi.org/10.1109/TIM.2007.911699},
tags = {testing},
researchr = {https://researchr.org/publication/YiSP08},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {57},
number = {5},
pages = {1071-1078},
}