Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara. Aging test strategy and adaptive test scheduling for SoC failure prediction. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 21-26, IEEE, 2010. [doi]
@inproceedings{YiYISKF10,
title = {Aging test strategy and adaptive test scheduling for SoC failure prediction},
author = {Hyunbean Yi and Tomokazu Yoneda and Michiko Inoue and Yasuo Sato and Seiji Kajihara and Hideo Fujiwara},
year = {2010},
doi = {10.1109/IOLTS.2010.5560239},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560239},
tags = {testing},
researchr = {https://researchr.org/publication/YiYISKF10},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece},
publisher = {IEEE},
isbn = {978-1-4244-7724-1},
}