Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara. Aging test strategy and adaptive test scheduling for SoC failure prediction. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 21-26, IEEE, 2010. [doi]
Abstract is missing.