Ender Yilmaz, Sule Ozev. Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. In 27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009. pages 313-318, IEEE, 2009. [doi]
@inproceedings{YilmazO09-2,
title = {Defect-based test optimization for analog/RF circuits for near-zero DPPM applications},
author = {Ender Yilmaz and Sule Ozev},
year = {2009},
doi = {10.1109/ICCD.2009.5413139},
url = {http://dx.doi.org/10.1109/ICCD.2009.5413139},
researchr = {https://researchr.org/publication/YilmazO09-2},
cites = {0},
citedby = {0},
pages = {313-318},
booktitle = {27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009},
publisher = {IEEE},
isbn = {978-1-4244-5029-9},
}