Adaptive quality binning for analog circuits

Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Adaptive quality binning for analog circuits. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

Authors

Ender Yilmaz

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Sule Ozev

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Kenneth M. Butler

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