Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Adaptive quality binning for analog circuits. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{YilmazOB13-0, title = {Adaptive quality binning for analog circuits}, author = {Ender Yilmaz and Sule Ozev and Kenneth M. Butler}, year = {2013}, doi = {10.1109/ETS.2013.6569357}, url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569357}, researchr = {https://researchr.org/publication/YilmazOB13-0}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-6376-1}, }