Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring

Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. VLSI Syst., 21(6):1116-1128, 2013. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.