Keun Soo Yim, Zbigniew Kalbarczyk, Ravishankar K. Iyer. Measurement-based analysis of fault and error sensitivities of dynamic memory. In Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010, Chicago, IL, USA, June 28 - July 1 2010. pages 431-436, IEEE, 2010. [doi]
Abstract is missing.