Yuxuan Yin, Rebecca Chen, Chen He, Peng Li. Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 99-104, IEEE, 2023. [doi]
@inproceedings{YinCHL23,
title = {Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data},
author = {Yuxuan Yin and Rebecca Chen and Chen He and Peng Li},
year = {2023},
doi = {10.1109/ITC51656.2023.00024},
url = {https://doi.org/10.1109/ITC51656.2023.00024},
researchr = {https://researchr.org/publication/YinCHL23},
cites = {0},
citedby = {0},
pages = {99-104},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}