An approach for robust data-driven fault detection with industrial application

Shen Yin, Guang Wang. An approach for robust data-driven fault detection with industrial application. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 3317-3322, IEEE, 2013. [doi]

Authors

Shen Yin

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Guang Wang

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