Shen Yin, Guang Wang. An approach for robust data-driven fault detection with industrial application. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 3317-3322, IEEE, 2013. [doi]
@inproceedings{YinW13-3,
title = {An approach for robust data-driven fault detection with industrial application},
author = {Shen Yin and Guang Wang},
year = {2013},
doi = {10.1109/IECON.2013.6699660},
url = {https://doi.org/10.1109/IECON.2013.6699660},
researchr = {https://researchr.org/publication/YinW13-3},
cites = {0},
citedby = {0},
pages = {3317-3322},
booktitle = {IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013},
publisher = {IEEE},
}