Yean Yin, Ke Zhang, WenBing Lu. Textile Flaw Classification by Wavelet Reconstruction and BP Neural Network. In Wen Yu, Haibo He, Nian Zhang, editors, Advances in Neural Networks - ISNN 2009, 6th International Symposium on Neural Networks, ISNN 2009, Wuhan, China, May 26-29, 2009, Proceedings, Part II. Volume 5552 of Lecture Notes in Computer Science, pages 694-701, Springer, 2009. [doi]
Abstract is missing.