Wai Kuan Yip, K. G. Law, Wen-Jau Lee. Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data. In IEEE Conference on Automation Science and Engineering, CASE 2007, September 22-25, 2007. Scottsdale, Arizona, USA. pages 478-483, IEEE, 2007. [doi]
Abstract is missing.