Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection

Raymond K. K. Yip, Peter Kwong-Shun Tam, Dennis N. K. Leung. Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection. IEEE Trans. Pattern Anal. Mach. Intell., 16(3):277-286, 1994. [doi]

Abstract

Abstract is missing.