Yoshisato Yokoyama, Yuichiro Ishii, Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi, Koji Nii. A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2015, Xia'men, China, November 9-11, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{YokoyamaIITTTN15, title = {A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU}, author = {Yoshisato Yokoyama and Yuichiro Ishii and Toshihiro Inada and Koji Tanaka and Miki Tanaka and Yoshiki Tsujihashi and Koji Nii}, year = {2015}, doi = {10.1109/ASSCC.2015.7387483}, url = {http://dx.doi.org/10.1109/ASSCC.2015.7387483}, researchr = {https://researchr.org/publication/YokoyamaIITTTN15}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2015, Xia'men, China, November 9-11, 2015}, publisher = {IEEE}, isbn = {978-1-4673-7191-9}, }