Tomokazu Yoneda, Michiko Inoue, Akira Taketani, Hideo Fujiwara. Seed Ordering and Selection for High Quality Delay Test. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 313-318, IEEE Computer Society, 2010. [doi]
Abstract is missing.