Tomokazu Yoneda, Tetsuo Uchiyama, Hideo Fujiwara. Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 415-422, IEEE Computer Society, 2003. [doi]
@inproceedings{YonedaUF03,
title = {Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability},
author = {Tomokazu Yoneda and Tetsuo Uchiyama and Hideo Fujiwara},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630415abs.htm},
tags = {optimization, rule-based, testing},
researchr = {https://researchr.org/publication/YonedaUF03},
cites = {0},
citedby = {0},
pages = {415-422},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}