Jae-Yong Yoo, Thomas Huehn, JongWon Kim. Active capture of wireless traces: overcome the lack in protocol analysis. In Ashutosh Sabharwal, Roger Karrer, Lin Zhong, editors, Proceedings of the Third ACM Workshop on Wireless Network Testbeds, Experimental Evaluation and Characterization, WINTECH 2008, San Francisco, California, USA, September 19, 2008. pages 41-48, ACM, 2008. [doi]
Abstract is missing.