Hoijin Yoon, Byoungju Choi. Inter-Class Test Technique Between Black-Box-Class and White-Box-Class for Component Customization Failures. In 6th Asia-Pacific Software Engineering Conference (APSEC 99), 7-10 December 1999, Takamatsu, Japan. pages 162-165, IEEE Computer Society, 1999. [doi]
@inproceedings{YoonC99, title = {Inter-Class Test Technique Between Black-Box-Class and White-Box-Class for Component Customization Failures}, author = {Hoijin Yoon and Byoungju Choi}, year = {1999}, url = {http://csdl.computer.org/comp/proceedings/apsec/1999/0509/00/05090162abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/YoonC99}, cites = {0}, citedby = {0}, pages = {162-165}, booktitle = {6th Asia-Pacific Software Engineering Conference (APSEC 99), 7-10 December 1999, Takamatsu, Japan}, publisher = {IEEE Computer Society}, isbn = {0-7695-0509-0}, }