Hoijin Yoon, Byoungju Choi. Inter-Class Test Technique Between Black-Box-Class and White-Box-Class for Component Customization Failures. In 6th Asia-Pacific Software Engineering Conference (APSEC 99), 7-10 December 1999, Takamatsu, Japan. pages 162-165, IEEE Computer Society, 1999. [doi]
Abstract is missing.