Jong-Hyeok Yoon, Muya Chang, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Arijit Raychowdhury. A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding. J. Solid-State Circuits, 57(3):845-857, 2022. [doi]
@article{YoonCKCCR22a,
title = {A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding},
author = {Jong-Hyeok Yoon and Muya Chang and Win-San Khwa and Yu-Der Chih and Meng-Fan Chang and Arijit Raychowdhury},
year = {2022},
doi = {10.1109/JSSC.2022.3141370},
url = {https://doi.org/10.1109/JSSC.2022.3141370},
researchr = {https://researchr.org/publication/YoonCKCCR22a},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {57},
number = {3},
pages = {845-857},
}