Jeongseop Yoon, Donghwan Kim, Daeyoung Kim. Arcface Based Open Set Recognition for Industrial Fault. In Kohei Arai, editor, Intelligent Systems and Applications - Proceedings of the 2022 Intelligent Systems Conference, IntelliSys 2022, Amsterdam, The Netherlands, 1-2 September, 2022, Volume 1. Volume 542 of Lecture Notes in Networks and Systems, pages 326-335, Springer, 2022. [doi]
@inproceedings{YoonKK22-0,
title = {Arcface Based Open Set Recognition for Industrial Fault},
author = {Jeongseop Yoon and Donghwan Kim and Daeyoung Kim},
year = {2022},
doi = {10.1007/978-3-031-16072-1_24},
url = {https://doi.org/10.1007/978-3-031-16072-1_24},
researchr = {https://researchr.org/publication/YoonKK22-0},
cites = {0},
citedby = {0},
pages = {326-335},
booktitle = {Intelligent Systems and Applications - Proceedings of the 2022 Intelligent Systems Conference, IntelliSys 2022, Amsterdam, The Netherlands, 1-2 September, 2022, Volume 1},
editor = {Kohei Arai},
volume = {542},
series = {Lecture Notes in Networks and Systems},
publisher = {Springer},
isbn = {978-3-031-16072-1},
}