Jeongseop Yoon, Donghwan Kim, Daeyoung Kim. Arcface Based Open Set Recognition for Industrial Fault. In Kohei Arai, editor, Intelligent Systems and Applications - Proceedings of the 2022 Intelligent Systems Conference, IntelliSys 2022, Amsterdam, The Netherlands, 1-2 September, 2022, Volume 1. Volume 542 of Lecture Notes in Networks and Systems, pages 326-335, Springer, 2022. [doi]
Abstract is missing.