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Gilsang Yoon, DongHyun Ko, Jounghun Park, Donghwi Kim, Jungsik Kim, Jeong-Soo Lee. Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory. IEEE Access, 10:62423-62428, 2022. [doi]